nanoSCAN project collaboration: betatesting of integrated photonic device for Structured Illumination Microscopy

Structured Illumination Microscopy (SIM) is a super-resolution imaging technique that uses a spatially modulated light pattern to excite sample fluorescence. This technique requires both pattern translations and rotations in order to obtain an isotropic resolution enhancement. The conventional methods that are used to perform this pattern manipulation are often slow, limiting acquisition speeds, or require expensive, delicate and alignment-sensitive optical elements.

As part of the nanoSCAN project, an integrated glass-based optical device fabricated by Femtosecond Laser Micromachining is proposed for versatile pattern generation and translation via integrated photonic circuits. Exploiting the inherent three-dimensional fabrication compatibility of FLM, waveguides are fabricated in a hexagonal configuration, allowing pattern translation and rotation without moving elements. This device was brought to IPHT for betatesting its capability to enable standard microscopes to achieve super-resolution for 2D and 3D imaging.

Photo of the integrated pattern generator brought to IPHT.